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Alpha Moisture Systems
Manufacture dewpoint meters, hygrometers and analyzers for the measurement of trace water in gases and dry compressed air, encompassing an overall range from +20C to -110C. Based in Bradford, England.
http://www.moisture.co.uk/
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Area Detector Systems Corporation
Manufacturer of CCD detectors, particularly in the X-ray range. Includes specifications, certification and technical support from Poway, California.
http://www.adsc-xray.com/
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Axic, Inc.
Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California.
http://www.axic.com/
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Cybertechnologies USA
Manufacturer of non-contact laser sensor-based measurement systems for industrial applications in Ogdensburg, New York.
http://www.cybertechnologiesusa.com/
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Dacell Co., Ltd.
Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea.
http://www.danaloadcell.com/
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Innova Air Tech Instruments A/S
Manufacturing systems for measurements in anaesthetic gas monitoring, fermentation monitoring, tracer gas, photoacoustic, ventilation and thermal comfort. Includes applications, publications, distribution from Ballerup, Denmark.
http://www.innova-airtech.com/
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Molecular Metrology, Inc.
Designs and manufactures x-ray scattering equipment, including complete instruments for small angle mode and two dimensional detectors. Includes specifications of systems and components, at Northampton, Massachusetts.
http://www.molmet.com/
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Oxford Microbeams Ltd.
Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England.
http://www.microbeams.co.uk/
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Physical Electronics, Inc.
Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation.
http://www.phi.com/
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